Sale!

Test Bank For Experiencing MIS (4th Edition) 4th by David M. Kroenke

Original price was: $68.00.Current price is: $55.00.

Testbank for Experiencing MIS (4th Edition) by David M. Kroenke.
  • Edition : 4th

  • Authors : David M. Kroenke

  • ISBN : 0132967480, 0132967480, 9780132967488

  • Publisher: David M. Kroenke

Availability: 10 in stock

Test bank Experiencing MIS (4th Edition) by David M. Kroenke.

Directed primarily toward students taking an undergraduate Introduction to Management Information Systems course, this text also provides practical content to current and aspiring industry professionals.

This modular text shows students how busin

Significant Qualities and Thorough Info

  • ISBN-10: 0132967480

  • ISBN-13: 9780132967488

  • Authors: David M. Kroenke

  • Publisher: David M. Kroenke

The Advantages Got From Utilizing Test bank for Experiencing MIS (4th Edition) by David M. Kroenke

  • Thorough Research Help: Test bank for Experiencing MIS (4th Edition) uses extensive descriptions and research aids that make it less complicated to bear in mind, understand, and become competent in essential principles.

  • Accessible Any place: Due to the fact that it is readily available in digital style, Test bank for Experiencing MIS (4th Edition) allows you to examine, prepare, and evaluation from any type of place, any time, making it a valuable device for teachers who are always on the action and students that are frequently learning.

  • Extremely Regarded: Test bank for Experiencing MIS (4th Edition) is a respected resource that is commonly made use of by pupils throughout the world. Your examination preparation will remain in the company of prominent people.

    Need a Sample?
    If you're interested in a sample before placing your order, simply reach out to us through our Contact Page. We're happy to assist you!

Reviews

There are no reviews yet.

Be the first to review “Test Bank For Experiencing MIS (4th Edition) 4th by David M. Kroenke”

Your email address will not be published. Required fields are marked *